|
Title
|
Programmable, automated transistor test system /
|
|
Format
|
online resource
|
|
Internet Access
|
https://purl.fdlp.gov/GPO/gpo105826
|
|
Author
|
Truong, Long V., author.
|
|
Published
|
Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Branch, February 1986.
|
|
|
|
|
SuDoc Number
|
NAS 1.60:2554
|
|
Item Number
|
0830-H-15 (online)
|
|
Description
|
1 online resource (22 pages) : illustrations.
|
|
Content Type
|
text
|
|
Series
|
(NASA technical paper ; 2554.)
|
|
General Note
|
"February 1986."
|
|
Bibliography
|
Includes bibliographical references (page 22).
|
|
Metadata Source
|
Description based on online resource, PDF version; title from title page (NASA, viewed July 13, 2018).
|
|
Subject - LC
|
Transistors -- Testing -- Computer programs.
|
|
|
Bipolar transistors -- Testing -- Computer programs.
|
|
|
Metal oxide semiconductors -- Testing -- Computer programs.
|
|
Added Entry
|
Sundberg, Gale R., author.
|
|
Added Entry
|
United States. National Aeronautics and Space Administration. Scientific and Technical Information Branch, issuing body.
|
|
|
Lewis Research Center.
|
|
Linking Field
|
Print version: Truong, Long V Programmable, automated transistor test system (OCoLC)36802305
|
|
|
Microfiche version: Truong, Long V Programmable, automated transistor test system (OCoLC)56611327
|
|
URL
|
Address at time of PURL creation https://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19860012284.pdf
|
|
|
|
|
Holdings
|
All items
|
|
|
|
|
OCLC Number
|
(OCoLC)761309631
|
|
CGP Record Link
|
https://catalog.gpo.gov:443/F/?func=direct&doc_number=001063994&local_base=GPO01PUB
|
|
System Number
|
001063994
|